ELECTRONIC MICROSCOPY PRODUCTS
Choose the product that best meets your needs
TESCAN desktop/compact solutions
TESCAN VEGA 4 COMPACT
Analytical SEM for routine materials characterization, research, and micrometer-scale quality control applications.
TESCAN solutions for routine and microanalysis
TESCAN VEGA 4
Analytical SEM for routine materials characterization, research, and micrometer-scale quality control applications.
TESCAN MIRA 4
High-resolution analytical SEM for routine materials characterization, research and quality control applications at submicron scale.
Ultra high resolution TESCAN UHR FESEM solutions
TESCAN CLARA 2
Versatile UHR cryo-SEM for characterizing your biological and other beam-sensitive samples.
TESCAN MAGNA
Advanced UHR SEM and STEM imaging for characterization of your biological and beam-sensitive samples.
TESCAN CLARA 2 CRYO
UHR Cryo-SEM for the characterization of your biological and other beam-sensitive samples.
TESCAN MAGNA BIO
Ultra-high resolution SEM UHR scanning microscope with subnanometer resolution for biology.
TESCAN FIB Dual Beam Solutions
TESCAN AMBER 2
Versatile nanoanalytical FIB-SEM to expand your materials research capabilities.
TESCAN AMBER 2 X
A unique combination of Plasma FIB and fieldless UHR FE-SEM for multi-scale materials characterization.
TESCAN SOLARIS X
A Plasma FIB-SEM platform for deep sectioning and the highest resolution for failure analysis in microelectronics.
TESCAN FIB CUSTOMIZED SOLUTIONS
TESCAN AMBER 2 CRYO
An alternative solution to prepare cryogenic slides for your TEM.
TESCAN SOLARIS Microelectrónica
A great alternative for the semi-automatic preparation of high-quality coverslips.
TESCAN SOLARIS BIO
UHR FIB-SEM avançado para caracterização 2D e 3D das suas amostras biológicas.
TESCAN TEM solutions
TESCAN TENSOR
The first integrated, precession-assisted and analytical near-UHV 4D-STEM.
TESCAN solutions for X-ray spectroscopy
TESCAN CLARA 2
Versatile UHR Cryo-SEM for characterizing your biological and other beam-sensitive samples
TESCAN VEGA 4
Analytical SEM for routine materials characterization, research, and micrometer-scale quality control applications.
TESCAN Solutions 3D X-ray Tomography
TESCAN CORETOM
Multi-resolution micro-CT system optimized for geoscience applications.
TESCAN UNITOM
A multiresolution micro-CT optimized for high throughput, diverse sample types and flexibility for your research.
TESCAN DYNATOM
Analytical SEM for routine materials characterization, research, and micrometer-scale quality control applications.
TESCAN RISE - RAMAN SEM Solutions
TESCAN RAMAN SEM
TESCAN RISE combines focal Raman microscopy with SEM microscopy (RISE) in an integrated microscope system.
TESCAN solutions for mineral analysis - TIMA
TESCAN TIMA Petrography
The combined microanalysis and automated petrography solution for geoscientists.
TESCAN TIMA Mineralogy
The automated mineralogy solution for particle-by-particle measurement of mineralogy, grind size, release and separation.
TESCAN TOF-SIMS solutions
TESCAN AMBER 2
Versatile nanoanalytical FIB-SEM to expand your materials research capabilities.
TESCAN solutions for 3D reconstruction and tomography
TESCAN CORETOM
Multi-resolution micro-CT system optimized for geoscience applications.
TESCAN UNITOM
A multiresolution micro-CT optimized for high throughput, diverse sample types and flexibility for your research.
TESCAN DYNATOM
Analytical SEM for routine materials characterization, research, and micrometer-scale quality control applications.
SEM Coater
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