ELECTRON MICROSCOPY
TESCAN is one of the world leaders in the design, manufacture and distribution of Scanning Electron Microscopes (SEM) and Focused Ion Beam Combined Scanning Electron Microscopy (FIB-SEM) workstations.
TESCAN together with its certified distributors like Zeppelin Metrology, provides authorized after-sales service, application specialists. and demonstration labs for all their microscopes.
TESCAN is a Czech producer of electron microscopes. The company was established in 1991 by R&D employees and service engineers of TESLA Company with the aim to continue in traditional production of electron microscopes in Brno. TESCAN presented its first instrument PROXIMA in 1996. This and other model ranges booked TESCAN its place among renowned world producers. Long-term expansion and establishment of subsidiaries worldwide culminated in 2013 with establishment of a holding with a French company ORSAY PHYSICS.
TESCAN strives to continually improve its products, creating a competitive advantage for its customers. The TESCAN brand has been consolidated thanks to the participation of the company in the best research projects and the cooperation with leading companies in the field of electron microscopy and microanalysis.
As a result, TESCAN’s innovative instrumentation and solutions have gained a leadership position in the world of nanotechnology and microtechnology.
TESCAN has supplied more than 3000 SEM microscopes all over the world, where more than 300 correspond to FIB microscopes, market segment where TESCAN has a privileged position.
At Zeppelin Metrology Lusitània we work every day to maintain the quality and after-sales standards that TESCAN requires and offers to its customers around the world.
TESCAN product categories
Desktop/compact TT/SEM microscopes
If what you are looking for is an economical microscope that is quick and easy to operate and at the same time so intuitive that it can be handled by non-specialized personnel after a few minutes of training, we can help you.
Routine microscopes and microanalysis
Classic, robust, reliable, easy-to-use electron microscope for your routine work and normally with EDX microanalysis, the TESCAN VEGA with its Tungsten/Wolfram filament is an excellent option.
Ultra high definition UHR FESEM microscopes
More advanced materials and nanotechnology require modern microscopy to solve problems where traditional imaging techniques are less effective.
FIB Dual Focus Ion Beam Microscopes
FIB microscopes; As they are popularly known, they combine the electron beam column with a second ion beam column. TESCAN, with more than 300 FIBs installed, is a pioneer in the field of focused ion microscopy.
TEM microscopes
Transmission electron microscopy (TEM) is a technique for high-resolution imaging of thin samples. The resolution of TEM is greater than that of the scanning electron microscope and is typically on the order of 0.2 nm.
EDX - X-ray Spectrometry
Energy scattering X-ray spectroscopy (EDX) and wavelength scattering X-ray spectroscopy (WDX) are two such techniques in which characteristic X-rays generated from electron beam interaction are analyzed.
MICRO CT X-ray tomography
Computed tomography or CT is a non-destructive imaging modality that provides much more than non-destructive testing (NDT) of materials and components.
RISE RAMAN SEM microscopes
RISE microscopy is a correlative microscopy technique, developed in 2015 by TESCAN and WITEC, that combines focal Raman microscopy with SEM microscopy (RISE) in an integrated microscope system.
Mineral analyzing microscopes
The TESCAN TIMA (Tescan Integrated Mineral Analyzer) automatic analyzer provides a versatile solution for petrographers and geoscientists, allowing them to perform much of their analytical work in this single solution.
TOF SIMS microscopes
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a highly sensitive analytical technique that provides chemical characterization of material surfaces.
3D reconstruction and tomography
There are three ways to perform a 3D tomography with an electron microscope, two are using the SEM itself directly and the third is to combine it sequentially with a high-resolution tomograph or micro-CT.
Consult the entire line of TESCAN electron microscopy products and discover the enormous scope of applications where this technology can be used.
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