ELECTRONIC MICROSCOPY PRODUCTS

TESCAN TENSOR

TESCAN TENSOR is the first 4D-STEM dedicated to the integrated, precession-assisted and analytical world.

For multimodal characterization of nanoscale morphological, chemical and structural properties of functional materials, thin films and synthetic particles, with excellent 4D-STEM performance and unprecedented usability.

· Scan synchronization with diffraction images, EDS acquisition and beam suppression.
· Integrated, near real-time 4D-STEM data analysis and processing
· Performance benefits of electron beam precession and near-UHV
· A new approach to the STEM user experience

4D-STEM analytical
The complete picture of electron beam interaction - sample

4D-STEM is the preferred microscopy method for true nanoscale multimodal characterization of material properties such as morphology, chemistry, and structure. At each pixel of the STEM dataset, TESCAN TENSOR acquires a quickly and perfectly synchronized diffraction pattern and EDS spectrum. Together, the diffraction and spectroscopy data encapsulate the complete picture of the interaction between the electron beam and the sample, from which a wide range of material properties can be derived.

Near real-time analysis and processing of 4D-STEM data​

A truly unique feature of TESCAN TENSOR is Explore, TENSOR's integrated platform for real-time processing and analysis of large-scale scanning electron diffraction datasets.  Explore offers 4D-STEM measurements to materials scientists, semiconductor and failure analysis researchers, and crystallographers, without the need for specialized knowledge in STEM optics or 4D-STEM data analysis and post-processing. Advanced users have the ability to adjust the predefined optimized optical properties for each STEM or 4D-STEM measurement to their preference.

Additionally, 4D-STEM data acquired with Virtual STEM measurement is compatible with open source computational platforms such as HyperSpy, LiberTEM or Py4DSTEM, available for advanced users to develop their own 4D-STEM measurements.

Differentiated 4D-STEM performance

The performance of TESCAN TENSOR's 4D-STEM capabilities is supported by ultrafast and precise scan synchronization with diffraction (direct electron) imaging, EDS acquisition, electron beam precession, beam suppression, and real-time analysis and processing of the acquired data. This was possible by integrating state-of-the-art components and techniques “from scratch”: · Hybrid pixel, direct electron detection (DED) · Near ultra-high vacuum within the sample area (near UHV) Precession electron diffraction (PED)· Fast, integrated beam suppression Solid, symmetrical, windowless wide-angle EDS· Real-time 4D-STEM analysis and processing (Explore)

TESCAN TENSOR: A ROD as easy to use as a SEM​

Scientists, engineers, technicians and students have long wanted a TEM solution that is easily usable without weeks or months of training in non-productive electro-optical adjustments and alignments. TESCAN TENSOR allows you to spend your time at the microscope interacting with your sample, rather than the optics. This is achieved by implementing “measurements” with predefined optical properties such as beam current, convergence angle, spot size and precession on or off, automatically adjusted and aligned. The result: an analytical 4D-STEM as easy to use as TESCAN SEMs, with all the efficiency and economic benefits of a results-based electron microscope. This approach can also generate economic benefits, such as improved accessibility for first-time users, leading to greater tool utilization and supporting return on investment.

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