TOMOGRAPHY PRODUCTS
TESCAN AMBER 2
Advanced Ga+ FIB-SEM for Automated
TEM Sample Preparation and Nanoprotoyping
TESCAN AMBER 2 is a fully automated Ga FIB-SEM for routine TEM sample preparation, nanoscale characterization, and prototyping.
Offering precision and ease of use, it delivers exceptionally high FIB image quality even at low accelerating voltages. The field-free BrightBeam™ SEM column ensures high contrast nanoscale imaging and exceptional sample versatility.
Whether preparing TEM samples, creating nanostructures, or characterizing nanomaterials, AMBER 2 is the perfect tool for a variety of use cases.
Image showing TEM sample prepared automatically in less than 1h using TEM AutoPrep ProTM
Automated TEM preparation
Automatically prepare high-quality TEM samples with minimal damage.
Lamella TEM advanced preparation
Achieve excellent quality, ideal geometry and minimal amorphization damage in TEM samples.
FIB Nano-prootyping
Fabricate, create or modify materials into functional devices using a single FIB-SEM instrument.
Advanced SEM Contrast methods
Improve surface sensitivity and detect different phases more effectively.
Electron beam lithography
Craft precise functional prototypes at nano and micro scales with TESCAN e-beam lithography and Fast Beam Blanker.
Friendly
Get high-quality data without needing extensive FIB-SEM experience
Benefits of AMBER 2
Automate your TEM sample preparation workflow with TESCAN AMBER 2, a fieldless Ga FIB-SEM system that offers an easy and reliable solution for automated and versatile TEM sample preparation.
Explore new TEM possibilities by preparing inverted or planar samples and transferring them to the grid with a nanomanipulator for precise feature orientation.
Fabricate, create, or modify functional devices with AMBER 2 capabilities for electron beam lithography, ion beam prototyping, FEBID, or FIBID, increasing design flexibility and creativity.
Simplify FIB-SEM operation with TESCAN Essence™ software, automate SEM and FIB alignments, and provide advanced-stage collision protection for all skill levels.
Perform ultra-high-resolution imaging and nanoanalysis
in multiple materials with the BrightBeam™ fieldless UHR-SEM column and Orage™ FIB high current column, ensuring excellent performance and versatility.
Gain deeper materials insights with AMBER’s multimodal detection system, enabling simultaneous acquisition of multiple signals.
Need more information?
Download Tescan AMBER 2 brochure
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