ELECTRONIC MICROSCOPY PRODUCTS
TESCAN MIRA 4
High-resolution analytical SEM for routine submicrometer-scale materials characterization, research, and quality control applications.
TESCAN MIRA is the fourth generation scanning electron microscope (SEM) with FEG Schottky field emission source, combining SEM imaging and live elemental composition analysis in a single Essence™ software window.
This combination significantly simplifies the acquisition of morphological and elemental data from samples, making MIRA SEM an efficient analytical solution for routine material inspection in quality control laboratories, for research, or for flaw detection and analysis.
General characteristics
– Analytical platform with fully integrated TESCAN Essence™ EDS, efficiently combining SEM imaging with elemental composition analysis in a single Essence™ software window.
– Optimal images and analytical conditions available immediately thanks to TESCAN’s unique apertureless optical design with In-flight Beam Tracing™ technology.
– Accurate and effortless SEM navigation within the sample from magnifications as low as 2× without the need for an additional optical navigation camera due to the unique Wide Field Optics™ design.Special SingleVac™ mode to observe beam-sensitive samples and prevent charge build-up in non-conductive samples without the need for metallization.
– Intuitive, modular Essence™ software designed for effortless operation regardless of user experience level.
– Guaranteed maximum safety of chamber-mounted detectors and accessories when the stage and sample are in motion with the Essence™ 3D Collision safety system.
– Configurable to your needs with optional column detectors including beam deceleration technology to improve image performance at lower accelerating voltages.
– True modular analytical platform that can be optionally equipped with the widest selection of fully integrated detectors (e.g. CL, water-cooled BSE spectrometer or RAMAN).
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